Optoelectronic Components and Materials Group

Prof. Stephen Forrest

Surface Science

(above) An ultra-high vacuum thin film analysis chamber connected to the OMDB system. This chamber features ultraviolet and x-ray photoemission spectroscopy as well as inverse photoemission spectroscopy to study the electronic properties of thin organic films.

(above) An EDAX energy dispersive x-ray spectrometer mounted to our scanning electron microscope is shown above. This instrument allows for depth resolved elemental analysis of thin film samples.