Optoelectronic Components and Materials Group

AFM

The atomic force microscope (AFM) shown above can measure the surface topography of a sample at the nano-scale.

Facilities

• Analysis & Spectroscopy

  • Lasers & Optics
  • Spectrometers
  • Surface Science

• Device Testing

  • OLED Testing
  • PV and Photodetector testing

• Microscopy & Metrology

  • AFM
  • Film Thickness
  • Optical Microscopy

• Thin Film Growth

  • Atomic Layer Deposition
  • Crystalline Organic Films
  • Molecular Beam Epitaxy
  • OLED Fabrication
  • Organic Film Patterning
  • Organic PV and Photodetector