Research
Reliability and fault tolerance are critical in today's embedded consumer commodity electronics. Aggressive technology scaling provides designers with an ever increasing budget of cheaper and faster transistors. Unfortunately, this trend is accompanied by a decline in individual device reliability as transistors become increasingly susceptible to soft errors.
We are quickly approaching a new era where resilience to soft errors
is no longer a luxury that can be reserved for just processors
in high-reliability, mission-critical domains. Even processors used
in mainstream computing will soon require protection. However,
due to tighter profit margins, reliable operation for these devices
must come at little or no cost.
This is what my research addresses.